Deutsches Elektronen-Synchrotron (DE)
Author in the following contributions
- ElectronCT - Imaging using Low-Emittance Electron Beams
- Allpix Squared - A Semiconductor Detector Simulation Framework
- Test Beam Characterization of a digital SiPM in 150 nm CMOS Imaging Technology
- Monte Carlo simulations of a beam telescope setup based on a 65 nm CMOS Imaging Technology
- Simulations and Test Beam Characterization of a MAPS in 65 nm CMOS Imaging Technology
