23–25 May 2011
Liverpool
Europe/Zurich timezone

Carrier recombination and emission lifetimes in heavily irradiated pad–detectors and their impact on operational characteristics of pin diodes.

23 May 2011, 14:20
20m
Liverpool

Liverpool

University of Liverpool Conference Office The Foresight Centre 1 Brownlow Street

Speaker

Eugenijus Gaubas

Author

Co-authors

Presentation materials