Speaker
Robert Stephen White
(Universita e INFN Torino (IT))
Description
The EXFLU1 batch of LGAD sensors on substrates of thickness between 15 and 45 $\mu$m were exposed to various radiation grades between 1 $\times$ 10$^{-14}$ and 5 $\times$ 10$^{-15}$ n$_{\mathrm{eq}}$cm$^{-2}$ using the neutron reactor at JSI. The sensor designs themselves, manufactured at FBK, are optimised to preserve characteristics at high fluences. The latest studies of the effects of radiation have been performed, with the impact on thin sensors of varying design considered for their characterisation pre- and post-irradiation, and are presented.
Primary authors
Alessandro Fondacci
(INFN Perugia (IT))
Arianna Morozzi
(INFN, Perugia (IT))
Cecilia Hanna
(Universita e INFN Torino (IT))
Daniele Passeri
(University & INFN, Perugia (IT))
Francesco Moscatelli
(IOM-CNR and INFN, Perugia (IT))
Giacomo Borghi
(Fondazione Bruno Kessler)
Giovanni Paternoster
(Fondazione Bruno Kessler)
Leonardo Lanteri
(Universita e INFN Torino (IT))
Luca Menzio
(Universita e INFN Torino (IT))
Marco Costa
(Universita e INFN Torino (IT))
Marco Ferrero
(Universita e INFN Torino (IT))
Matteo Centis Vignali
(FBK)
Maurizio Boscardin
(FBK Trento)
Nadia Pastrone
(Universita e INFN Torino (IT))
Nicolo Cartiglia
(INFN Torino (IT))
Robert Stephen White
(Universita e INFN Torino (IT))
Roberta Arcidiacono
(Universita e INFN Torino (IT))
Roberto Mulargia
(University & INFN Turin (IT))
Simona Giordanengo
(Istituto Nazionale di Fisica Nucleare)
Tommaso Croci
Valentina Sola
(Universita e INFN Torino (IT))
