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19 February 2024
FEI STU, Bratislava
Europe/Zurich timezone

Metrology and digitization for the highest accuracy class power converters in High Luminosity LHC at CERN

19 Feb 2024, 13:10
2h
Auditorium BC150 (FEI STU, Bratislava)

Auditorium BC150

FEI STU, Bratislava

Slovak University of Technology in Bratislava Faculty of Electrical Engineering and Information Technology Ilkovičova 3 841 04 Bratislava

Speaker

Nikolai Beev (CERN)

Description

PART 1
I. Introduction
- What we do at CERN (in general, Electrical Power Converter group, High Precision Measurements section)
- The need for high precision + high dynamic range + stability
- Unique challenges - environment, reliability, maintainability, etc. Differences between a metrology lab and accelererator tunnel. Measurements for closed-loop control and real-time applications
- “The best digitizer” vs “the best trade-off”: What is really needed in our case?
- The complete high precision measurement chain: from high current through low voltage to digital code
- Supporting the measurement chain: test and calibration infrastructure

II. Development of high-performance digitizers at CERN

  • Development, deployment and use of DS22
  • Other digitizers - FGC internal ADCs, PAM, PAMB, etc.
  • From LHC to HL-LHC. New requirements and needs
  • From DS22 to DS24. Upgrade of dipole circuits
  • Evaluation of commercial ADC integrated circuits, comparison of relevant parameters

PART 2
III. HL-LHC Class 0. HPM7177

  • The AD7177-2 ADC
  • Building a digitizer around an ADC. A system-level view
  • The input signal path. Fully differential circuits
  • Supporting circuits and sub-systems. Module-level temperature stabilization
  • Component level: precision resistors and resistor networks; stable capacitors; voltage references
  • Interaction with other systems – connections, communication, EMC
  • Sources of measurement error and uncertainty

IV. Proving digitizer performance

  • The limits of classical metrology equipment. Performance limitations of buried Zeners
  • Voltage calibration infrastructure at CERN
  • Going beyond the specs – examples from CDC testing, cross-PSD estimation
  • Going straight to the top – PJVS tests at PTB

Primary author

Presentation materials