Speaker
Dr
Filippo Giorgi
(INFN Bologna and Physics Department (IT))
Description
The Young-Feynman two-slit experiment for single electrons has been carried out by inserting in a conventional transmission electron microscope (TEM) two nanometric slits and a fast recording system able to measure the electron arrival-time. The detector, designed for experiments in future colliders such as those foreseen for the SuperB project, is based on a custom CMOS chip of 4096 monolithic active pixels equipped with a fast readout chain able to manage up to 10^6 low-occupancy frames per second. In particular, the chip was designed using a 130 nm CMOS technology via ST silicon foundry. Moreover, the chip has been tested with protons in a beam-test at CERN in fall 2008 and the results will be summarized. However, here, the chip has been used to detect the elecrons accelerated up to some tens of keV (<120 keV) inside a TEM.
Using this detector and its fast readout chain in this way, high statistic samples of single electron events can be collected within a time interval short enough to guarantee the stability of the system and coherence conditions of the illumination. For the first time in a single electron two-slit experiment, the time distribution of electron arrivals has been measured.
Authors
Dr
Alessandro Gabrielli
(INFN Bologna and Physics Department (IT))
Prof.
Antonio Zoccoli
(INFN Bologna and Physics Department (IT))
Dr
Filippo Giorgi
(INFN Bologna and Physics Department (IT))
Dr
Giancarlo Gazzadi
(CNR-Institute of Nanoscience, Modena)
Dr
Giorgio Matteucci
(Physics Department University of Bologna (IT))
Prof.
Giulio Pozzi
(Physics Department University of Bologna (IT))
Prof.
Mauro Villa
(INFN Bologna and Physics Department (IT))
Prof.
Nicola Semprini Cesari
(INFN Bologna and Physics Department (IT))
Prof.
Stefano Frabboni
(Department of Physics, University of Modena and Reggio Emilia)