2–7 Sept 2012
Hotel Listel Inawashiro, Inawashiro, Japan
Japan timezone

Single Event Effect Characterization of the Analog ASIC Developed for CCD Camera in Astronomical Use

6 Sept 2012, 13:50
20m
Hotel Listel Inawashiro, Inawashiro, Japan

Hotel Listel Inawashiro, Inawashiro, Japan

Kawageta, Inawashiro, Fukushima 969-2696
ORAL Radiation effects Session7

Speaker

Hiroshi Nakajima (Osaka University)

Description

Single-event measurements on the analog ASIC developed for astronomical CCD camera systems are reported. The experiments using several heavy ions and protons exhibited positive correlation between the particle's LET (linear energy transfer) and the probability of the SEU (single event upset). The predictive SEU rate in the low earth orbit was derived on the assumption of the CCD camera (SXI) onboard ASTRO-H, the next Japanese X-ray astronomical satellite. The upper limit of the SEU rate of 4.6x10^-3 evts/sec is sufficiently low compared with the non X-ray background of SXI. We also report on the radiation tolerance of our device against SEL (single event latch-up).

Author

Hiroshi Nakajima (Osaka University)

Co-authors

Mr Hideki Mori (Osaka University) Mr Hiroaki Kan (Osaka University) Prof. Hirokazu Ikeda (ISAS/JAXA) Ms Hiroko Kosugi (Osaka University) Prof. Hiroshi Tsunemi (Osaka University) Dr Hisashi Kitamura (NIRS) Dr John Doty (Noqsi Aerospace Ltd.) Dr Kiyoshi Hayashida (Osaka University) Ms Mari Fujikawa (Osaka University) Dr Naohisa Anabuki (Osaka University) Mr Shutaro Ueda (Osaka University) Dr Yukio Uchihori (NIRS)

Presentation materials