Speaker
Hiroshi Nakajima
(Osaka University)
Description
Single-event measurements on the analog ASIC developed for
astronomical CCD camera systems are reported. The experiments
using several heavy ions and protons exhibited positive correlation
between the particle's LET (linear energy transfer) and the probability
of the SEU (single event upset). The predictive SEU rate in the low
earth orbit was derived on the assumption of the CCD camera (SXI)
onboard ASTRO-H, the next Japanese X-ray astronomical satellite.
The upper limit of the SEU rate of 4.6x10^-3 evts/sec is sufficiently
low compared with the non X-ray background of SXI. We also report
on the radiation tolerance of our device against SEL (single event latch-up).
Author
Hiroshi Nakajima
(Osaka University)
Co-authors
Mr
Hideki Mori
(Osaka University)
Mr
Hiroaki Kan
(Osaka University)
Prof.
Hirokazu Ikeda
(ISAS/JAXA)
Ms
Hiroko Kosugi
(Osaka University)
Prof.
Hiroshi Tsunemi
(Osaka University)
Dr
Hisashi Kitamura
(NIRS)
Dr
John Doty
(Noqsi Aerospace Ltd.)
Dr
Kiyoshi Hayashida
(Osaka University)
Ms
Mari Fujikawa
(Osaka University)
Dr
Naohisa Anabuki
(Osaka University)
Mr
Shutaro Ueda
(Osaka University)
Dr
Yukio Uchihori
(NIRS)
