6–10 Jul 2025
Bratislava, Slovakia
Europe/Zurich timezone

Characterization and X-ray imaging of metal halide perovskite scintillator films for digital flat-panel detector

Not scheduled
20m
Bratislava, Slovakia

Bratislava, Slovakia

poster

Speaker

보경 차

Description

Digital flat-panel detectors with indirect method typically uses amorphous silicon TFT (thin film transistor) or silicon CMOS (complementary metal oxide semiconductor) matrix arrays integrated with various scintillators for many medical diagnosis, security and nondestructive examination. Scintillator material is an indispensable component of indirect X-ray detector, which converts high-energy ionizing radiation (X-rays or γ-rays) into visible light. Over the past decades, tremendous efforts have been continued to exploring excellent scintillators for radiation detection and many kinds of scintillators have been commercialized. However, it is still necessary to develop novel scintillator materials with low-cost, high light yields and short decay time to satisfy the high-speed radiation detection technology.
In recent years, metal halide perovskite nanocrystals (NCs) have been reported as a promising scintillator for X-ray detection and imaging. In this work, high efficient scintillating films such as granular type metal halide perovksite materials with different thickness film(50-200um) were designed for high luminescent and spatial resolution in digital X-ray imaging detectors. The high-resolution dynaminc CMOS flat panel detectors as light sensing backplane in this experiment are consisted of silicon photodiode array with 50μm pixel pitch(theoretical resolution limit: 10lp/mm) and 100μm pixel pitch (theoretical resolution limit: 5lp/mm) respectively.
The microstructures and scintillation properties uch as emission spectrum and light intensity by X-ray luminescence(XL) were measured and characterized. Their X-ray imaging of CMOS flat panel imagers in combination with metal halide perovskite scintillation screens were investigated in terms of the relative light response to given X-ray irradiation, modulation transfer function (MTF), noise power spectrum and X-ray imaging with various phantom. We expect that these results will show potential for high speed and spatial resolution in digital X-ray imaging such as medical and industrial fields.

Workshop topics Sensor materials, device processing & technologies

Authors

Prof. , Chang-Woo Seo (Yonsei University) Dr Chur Kim (KERI) Mr Duhee Jeon (Yonsei University) Prof. Hyosung Cho (Yonsei University) Dr Sungchae Jeon (KERI) Mr Woo-Sung Kim (Yonsei University) 보경 차

Presentation materials