Speakers
Description
Our research group is developing a novel, ultra-high resolution, Xray sensor for use in medical imaging CT. The sensor is an edge-on deep-silicon sensor and achieves the resolution by performing charge-fitting on the signal from adjacent pixels for single interactions.
In previous comparisons between measurements and simulations it has been noted that the amount of charge sharing is less in the simulations than in the measurements. It is hypothesized that one source of this discrepancy is the lack of coulomb repulsion in the simulations, whose effect would cause the cloud charge-carrier to spread out further.
To investigate the effect of the coulomb repulsion on the charge cloud diffusion, our research group have added the coulomb repulsion functionality in a new propagation module based on the Transient Propagation module.
Different interaction energies are simulated at different distances from the collection electrodes, and the effects of the coulomb repulsion on the induced current and the charge cloud size will be presented together with the effects of the coulomb repulsion using the novel sensor.
| Will the talk be given in person or remotely? | In person |
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