Workshop on Quality Issues in Current and Future Silicon Detectors

Name: Workshop on Quality Issues in Current and Future Silicon Detectors
Start: 2011-11-03T09:00:00+01:00
End: 2011-11-04T18:00:00+01:00
Location: CERN

3–4 Nov 2011

CERN

Europe/Zurich timezone

Overview
First Announcement
Scientific Programme
Timetable
Speaker List
Registration
Participant List
Access to CERN
Conference room location and CERN map
Accommodation
Visitors' laptop registration
Poster
- printable ver.
Workshop Dinner Info and Menu

Electrical, Electronic, and Electromechanical (EEE) Parts Approval Process for NASA/Johnson Space Center

3 Nov 2011, 16:40

222/R-001 (CERN)

222/R-001

CERN

Building 222-R-001

200

Show room on map

Introduction and non-HEP Quality Issues

Pamela Branch (NASA/Johnson Space Center)

via videoconference from Houston, USA

Slides

CERN_Wrkshp-NASA_EEE_Parts_Process_11-3-2011.pdf

Workshop on Quality Issues in Current and Future Silicon Detectors

Electrical, Electronic, and Electromechanical (EEE) Parts Approval Process for NASA/Johnson Space Center

222/R-001

CERN

Speaker

Description

Presentation materials

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Workshop on Quality Issues in Current and Future Silicon Detectors

Speaker

Description

Presentation materials