17–19 Feb 2026
Palazzo dei Priori, Perugia, Italy
Europe/Rome timezone

Parylene Aluminium Filters (ParAlF) for Silicon based X-ray Detection Systems

17 Feb 2026, 14:45
1m
Sala dei Notari (Palazzo dei Priori, Perugia, Italy)

Sala dei Notari

Palazzo dei Priori, Perugia, Italy

Piazza 4 Novembre - PERUGIA ITALY

Speaker

Smiriti Srivastava (INAF OAS Bologna, Italy)

Description

Next generation of high energy astrophysics missions require state-of-art Silicon based X-ray detectors to operate with maximum sensitivity, broad energy passband and microsecond timing resolution. Such high requirements demand minimal optical light contamination from outer space. While off-chip filter assemblies currently meet these operational requirements, they can degrade low energy X-ray response due to introduction of dead layers and entry of optical background radiations through detector-filter gaps. Supported by the INAF Fundamental Research Program 2023, with the ParAlF (Parylene Aluminium Filters) project we started to investigate the performance of glass slides and Si PiN detectors with on-surface Parylene and Aluminium thin film deposition. ParAlF is essentially driven by the performance requirements of Silicon Drift Detectors (SDDs) for the X and Gamma Imaging Spectrometer (XGIS) instrument proposed for the Transient High Energy Sky and Early Universe Surveyor (THESEUS) mission, however the outcomes of the project are suitable for any Silicon based X-ray detection systems beyond future space missions. This work reports the procedures utilized for glass and Si PiN sample characterizations, on-surface Parylene and Aluminium deposition processes and outlines the planned next steps derived from performance results.

Author

Smiriti Srivastava (INAF OAS Bologna, Italy)

Co-authors

Dr Claudio Labanti (INAF-OAS Bologna, Italy) Enrico Virgilli (Istituto Nazionale di Astrofisica - INAF OAS Bologna) Dr Lorenzo Amati (INAF - OAS Bologna) Riccardo Campana (INAF/OAS)

Presentation materials