Belle II SVD-PXD Meeting

Session

PXD: ASICs

6 Feb 2012, 14:00

University of Technology, Vienna, Austria

Conveners

PXD: ASICs

• Hans Krüger

80. DCDB Probecard-tests

Lukas Raffelt (Uni Heidelberg)

06/02/2012, 14:00

81. Measurements on SDS Chip - a 65nm Readout Chip Prototype for DEPFET

Dr Ivan Peric (Ruprecht-Karls-Universitaet Heidelberg (DE))

06/02/2012, 14:15

82. Measurements on TSMC 65nm Test Chip DHPT 0.1

Hans Krueger (Rheinische-Friedrich-Wilhelms- Univ.-Univ. Bonn, Physikalisches)

06/02/2012, 14:35