Lawrence Berkeley National Lab. (US)
Author in the following contributions
- Production Test Engineering in FE-I4 System-on-Chip to boost the Reliability and High-Quality demands in IBL applications
- SEU tolerant latches design for the ATLAS pixel readout chip
- Results of 65nm pixel readout chip demonstrator array
- Characterization of FE-I4B pixel readout chip production run for ATLAS Insertable B-Layer upgrade.
- First experience with radiation-hard active sensors in 180 nm HV CMOS technology
