8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Name: 8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)
Start: 2007-06-27T09:00:00+02:00
End: 2007-06-29T19:00:00+02:00
Location: Florence, Italy

27–29 Jun 2007

Florence, Italy

Europe/Zurich timezone

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Carlo.Civinini@fi.infn.it

Development, realization and test of an electronic data acquisition board for the NEMO experiment

29 Jun 2007, 09:55

25m

Sala Convegni della Cassa di Risparmio di Firenze (Florence, Italy)

Sala Convegni della Cassa di Risparmio di Firenze

Florence, Italy

Via F. Portinari, 5

Day 3 - Morning session

Dr Filippo Giorgi (INFN- Bologna)

Slides

giorgi.pdf

giorgi.ppt

8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Support

Development, realization and test of an electronic data acquisition board for the NEMO experiment

Sala Convegni della Cassa di Risparmio di Firenze

Florence, Italy

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Presentation materials

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8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Support

Speaker

Primary author

Presentation materials