Speaker
Mr
Mohamed Bouterfa
(Université catholique de Louvain)
Description
For precise treatment purposes in hadrontherapy, the particle beam has to be monitored in real time without being degraded. For the first time, silicon strip detectors have been fabricated over an area as large as 4.5cm x 4.5cm with ultra low thickness of 20µm. Ultra-thin detectors offer the following considerable advantages: a significantly reduced beam scattering, a higher radiation hardness which leads to an improved detector lifetime, and a much better collection efficiency.
In a previous work, the novel sensor has been described and a global macroscopic dosimetry characterization has been proposed. The latter characterization provides practical information for the detector daily use however it does not help to improve the local microscopic knowledge of the sensor. This work therefore presents a micrometric-accuracy collection characterization of this new generation of ultra-thin silicon strip detectors.
This goal is reached thanks to a 1060nm-wavelength micrometric-sized laser that can be positioned relatively to the sensor with a submicron precision for the three different axes.
The measured charge collection mapping over the wafer surface was compared to device simulations performed on ATLAS (Silvaco).
This study gives a much better knowledge of the inefficient areas of the sensor and allows therefore optimization for future designs.
| quote your primary experiment | detector collection mapping |
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Primary author
Mr
Mohamed Bouterfa
(Université catholique de Louvain)
Co-authors
Prof.
Denis Flandre
(Université catholique de Louvain)
Prof.
Eduardo Cortina Gil
(Université catholique de Louvain)
Mr
Geoffrey Alexandre
(Université catholique de Louvain)
