11-15 February 2013
Vienna University of Technology
Europe/Vienna timezone

All-in-one readout electronics for Belle-II Central Drift Chamber

Not scheduled
50m
Vienna University of Technology

Vienna University of Technology

Gußhausstraße 25-29, 1040 Wien (Vienna), Austria
Board: 80
Poster Electronics

Speaker

Dr Nanae Taniguchi (KEK)

Description

For the Belle-II experiment at KEK, a Central Drift Chamber (CDC) with a readout electronics are required to be upgraded to cope with the design luminosity of 8 x 10^35/cm^2s. The readout electronics system will be completely replaced. The new readout electronics system must handle higher trigger rates with less dead time. The front-end electronics are located close to detector and send digitized signal through optical fibers. The new ASIC chips, FADC and FPGA are assembled on a single board. An amplifier, shaper and discriminator are implemented in the ASIC chip. The drift time and signal charged are measured with a TDC on the FPGA and a slow FADC, respectively. In this talk, the latest results of the R&D and the performance of the readout board with test beam will be presented.
quote your primary experiment Belle II

Primary author

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