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Nov 14 – 16, 2012
CERN
Europe/Zurich timezone

Investigation of Charge Multiplication in Silicon Strip Sensors

Nov 15, 2012, 5:35 PM
15m
CERN

CERN

6-2-024 on 14th & 15th Nov. 222-R-001 on 16th Nov.

Speaker

Robert Eber (KIT - Karlsruhe Institute of Technology (DE))

Description

Dedicated sensors provided by RD50 were irradiated with neutrons or protons to 1e15neq/cm2 and 5e15neq/cm2. Charge collection, Signal to noise and leakage current of sensors with different pitch to width ratios have been measured as a function of annealing time and will be shown.

Primary authors

Lokman Altan (KIT) Robert Eber (KIT - Karlsruhe Institute of Technology (DE)) Wim De Boer (KIT - Karlsruhe Institute of Technology (DE))

Presentation materials