Speaker
Dr
Fco.Rogelio Palomo Pinto
(University of Sevilla, School of Engineering)
Description
On the characterization by experiments and simulation of the possibilities of nanometric MOS capacitors for DDD dosimetry.
Author
Dr
Fco.Rogelio Palomo Pinto
(University of Sevilla, School of Engineering)
Co-authors
Mr
Pablo Fernández-Martínez
(Centro Nacional de Microelectrónica Barcelona CSIC)
Dr
Salvador Hidalgo Villena
(Centro Nacional de Microelectrónica Barcelona CSIC)
