Speaker
Vitaliy Fadeyev
(University of California,Santa Cruz (US))
Description
We are pursuing a “slim edge” technology which allows a drastic reduction of inactive region along the perimeter of silicon detectors. Such reduction would benefit construction of large-area tracker and imaging systems. Key components of this method are surface scribing, cleaving, and passivation of the resulting sidewall. We will give a short overview of the project and describe recent progress. A particular emphasis will be given to device performance physics: charge collection near the edge and irradiation studies.
Primary author
Vitaliy Fadeyev
(University of California,Santa Cruz (US))
Co-authors
Mr
Colin Parker
(UCSC)
Prof.
Gian-Franco Dalla Betta
(INFN and University of Trento)
Giulio Pellegrini
(Universidad de Valencia (ES))
Hartmut Sadrozinski
(SCIPP, UC santa Cruz)
Mr
Jeffrey Ngo
(UCSC)
Dr
Miguel Ullan Comes
(Universidad de Valencia (ES))
Mr
Scott Ely
(UCSC)
Victor Hugo Benitez Casma
(Universidad de Valencia (ES))
