8th "Trento" Workshop on Advanced Silicon Radiation Detectors (3D and p-type)

Update on CCE results with very thin (50µm) Si detectors

18 Feb 2013, 15:40

20m

"Stringa" Conference Hall (FBK, Trento)

Planar Sensors 1

Speaker

Gianluigi Casse (University of Liverpool (GB))

Description

The effect of thickness on the CCE performances after irradiation is here investigated with measurements taken with a 50µm thick microstrip detectors irradiated at about 2.2 Neq cm-2.

Presentation materials

Slides

trento-2013.pdf

trento-2013.pptx