-
13:30
Electrical characterization of p- and n- type 150um epi-Si diodes irradiated by protons and neutrons
-
Volodymyr Khomenkov
(Hamburg University)
-
13:50
Annealing studies on MCz after 23 GeV proton irradiation and CCE of 150um epitaxial silicon devices
-
Katharina Kaska
(CERN)
-
14:10
Systematic TCT Investigation of Equal-Double-Junctions in 24 GeV Proton Irradiated MCZ n and p-type Si Detectors
-
Jaakko Harkonen
(HIP)
-
14:30
On MCz SCSI after 24 GeV/c proton irradiation
-
Donato Creanza
(University/INFN Bari)
-
15:20
Comparison of proton damage in thin FZ, MCz and epitaxial silicon detectors
-
Doris Eckstein
(Hamburg University)
-
15:40
C-V/IV and CCE measurements of MCz and FZ p and n type diodes after mixed irradiations
-
Gregor Kramberger
(Jozef Stefan Institute)
-
16:00
Discussion Session: Defect Engineering & Pad Detectors (MCZ, EPI, FZ)
-
Eckhart Fretwurst
(Unversity of Hamburg, Germany)
Gregor Kramberger
(Jozef Stefan Institute)