Front End Electronics (FEE 2014)

Name: Front End Electronics (FEE 2014)
Start: 2014-05-19T18:00:00-05:00
End: 2014-05-23T18:00:00-05:00
Location: Argonne National Laboratory

19–23 May 2014

Argonne National Laboratory

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Radiation Damage Tests at 1 Grad Dose on 65 nm CMOS Transistors

23 May 2014, 10:15

25m

Energy Sciences Building (Argonne National Laboratory)

Energy Sciences Building

Argonne National Laboratory

Argonne National Laboratory 9700 S. Cass Avenue Lemont, IL 60439

Advanced CMOS and Extreme Environments Session II

Marlon Benoit Barbero (CPPM France)

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Rad_damage_65nm.ppt

Front End Electronics (FEE 2014)

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Radiation Damage Tests at 1 Grad Dose on 65 nm CMOS Transistors

Energy Sciences Building

Argonne National Laboratory

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Front End Electronics (FEE 2014)

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