Speaker
Eric Fossum
Description
Analytical and experimental results with the Digital Integration Sensor (DIS) and with the Quanta Image Sensor imaging concepts, including dynamic range extension and realization, are reported. The “quantized” DIS (qDIS) concept is also proposed. The continuum between the conventional CMOS APS, the DIS, the qDIS and the QIS is discussed as a sort of roadmap, along with trades in power and performance enhancement. Imaging performance metrics of single-bit and multi-bit photo-electron-counting Quanta Image Sensors (QIS) are analyzed using Poisson arrival statistics. Signal and noise as a function of exposure are determined. Simulation of binary data acquisition and image formation was performed. Initial analysis and simulation of a readout signal chain has been performed and bounds on power dissipation established. Photodetector device concepts have been explored using TCAD. The D-log H characteristic of single-bit sensors including overexposure latitude is quantified. Linearity and dynamic range are also investigated. Read-noise-induced bit-error rate is analyzed and a read-noise target of less than 0.15 e- rms is suggested.
