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09:00
Workshop opening
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Ionut Enculescu
(Director of NIMP, Bucharest)
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09:05
Workshop opening
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Ioana Pintilie
(NIMP Bucharest-Magurele, Romania)
Michael Moll
(CERN)
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09:10
Investigation of point and extended defects in electron irradiated silicon – dependence on the particle energy
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Roxana Radu
(National Institute of Materials Physics NIMP, Bucharest, Romania)
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09:30
Effect of background impurities and electronic excitation on the behavior of radiation induced interstitial boron complexes
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Leonid Makarenko
(B)
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09:50
A<sub>Si</sub>-Si<sub>i</sub> defect as possible origin of electronically activated degradation of boron and indium doped silicon
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Kevin Lauer
(CiS Forschungsinstitut für Mikrosensorik und Photovoltaik GmbH)
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10:10
Electron Induced Damage in Silicon - TRIM and TCAS Simulations
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Gunnar Lindstroem
(University of Hamburg)
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11:00
Modelling Vacancy-Interstitial Clusters and their effect on on Carrier Transport in Silicon
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Ernestas Zasinas
(Vilnius University)
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11:20
ESR investigation of paramagnetic point defects in O doped crystalline Si-FZ irradiated with 27 MeV electrons
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S.V. Nistor
(NIMP - Magurele (RO))
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11:40
High resolution transmission electron microscopy (HRTEM) investigations of silicon irradiated with high energy electrons
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Leona Nistor
(NIMP Bucharest-Magurele (RO))
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12:00
Discussion: Defect and Material Characterization
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Ioana Pintilie
(NIMP Bucharest-Magurele, Romania)