(1) Industrial Challenges for Electronics and Landmarks in Terrestrial Single-Event Effects (SEE) <br> (2) Anomalies of Electronics Associated with Radiation Effects and the Role of Space Agencies </br>
(1) Industrial Challenges for Electronics and Landmarks in Terrestrial Single-Event Effects (SEE)
[R. Baumann, Texas Instruments, Leader of Radiation Effects Group]
The single-event upset (SEE) is a key threat to advanced commercial electronic components and systems. Whether in a cluster of workstations, a router hub, or an automotive or avionics control system, left unchallenged, SEEs have the potential for inducing the highest failure rate of all other reliability mechanisms combined. We show several real-world examples of the impact. We also briefly review the types of SEE failure modes and the dominant terrestrial radiation mechanisms. The SEE sensitivity as a function of technology scaling is also presented with a consideration of which applications are most likely to require mitigation. Finally, we consider challenges for future commercial semiconductor technology development and the types of facilities that will be needed to quantify and qualify future products.
(2) Anomalies of Electronics Associated with Radiation Effects and the Role of Space Agencies
[R. Ecoffet, Head of the Radiation Effects Department at CNES]
Spacecraft anomalies due to radiation effects on electronic devices have been known since the very beginning of the space era. They represent today a major part of on-board anomalies, mission outages and unexpected workload on ground controllers of operational systems. This talk will first describe a sample of known cases of cumulated and transient effects in Earth or planetary environments. Risks of overall mission impact will then be illustrated. Finally, we will expose how links are organized in space agencies and companies between radiation experts and project teams for dealing with this challenge. The importance of the "radiation engineer" function will be emphasized.
ATS Seminars Organisers: H. Burkhardt (BE), M. Modena (TE), T. Stora (EN)
Coffee / tea will be served after the seminar