Speaker
Gregor Kramberger
(Jozef Stefan Institute)
Description
A set of MICRON diodes was irradiated with different fluences of protons and pions up to 1.1e15 p/cm2 followed by additional 2e14 n/cm2. The compensation of the stable damage due to neutron and charged hadron irradiation was observed for the MCz-n samples, while for FZ detectors the damage scales with equivalent fluence. The diodes were annealed up to 10000 min at 60C in steps, during which CV-IV and CCE measurements were performed.
Author
Gregor Kramberger
(Jozef Stefan Institute)
Co-authors
Dr
Igor Mandic
(Jozef Stefan Institute)
Dr
Irena Dolenc
(Jozef Stefan Institute)
Prof.
Marko Mikuz
(Jozef Stefan Institute)
Prof.
Vladimir Cindro
(Jozef Stefan Institute)
