30 June 2016 to 1 July 2016
Other Institutes
Europe/Zurich timezone

Highly granular MAPS detectors with fully integrated data processing for particle detection and imaging

Not scheduled
10m
Auditorium & Conference Room (Other Institutes)

Auditorium & Conference Room

Other Institutes

ESADE Business School, Avenida Pedralbes, 60-62, 08034 Barcelona, Spain.

Speakers

Adrian Bevan (University of London (GB)) Marcel Stanitzki (Deutsches Elektronen-Synchrotron (DE)) Steven Worm (STFC - Rutherford Appleton Lab. (GB))

Description

The next generation of CMOS MAPS detectors for particle physics applications are
driven by the need for optimal resolution, which requires high pixel
granularity and minimal material. At the same time, the need for high-speed
readout imply sophisticated in-pixel and on-sensor data processing, which is
very difficult to achieve with current technologies. Hybrid solutions are
prohibitive in terms of material and cost. A natural way forward is to move in
the third dimension and to stack several CMOS layers on top of each other.
This will allow all the necessary in-pixel electronics to be distributed over
several CMOS layers and to separate analog front-end and digital back-end of
each pixel. However, the technological advantages do not stop there as
individual layers can now be optimized for a particular functionality which then
allows us to take advantage of the best materials and processing
for: sensing, digital and mixed mode applications. The availability of deep-submicron
(65 nm or smaller) layers will enable us to integrate advanced digital data-processing like e.g.
machine-learning-based clustering, or to provide precise sub-ns timing for pixel
hits, providing a key ingredient for a 4D-Tracking approach. By combining the
hits over several sensitive layers we can form tracklets within a sensor unit,
which can further reduce the occupancy due to fake hits or extremely
low-momentum tracks. In the next few years there will be a paradigm shift in the
way we construct tracking detectors which will allow us to exploit flexible and
adaptive technologies to optimize performance.

Summary

MAPS, Stacking, deep sub-micron , CMOS, 3D Integration

Primary author

Marcel Stanitzki (Deutsches Elektronen-Synchrotron (DE))

Co-authors

Adrian Bevan (University of London (GB)) Felix Sefkow (Deutsches Elektronen-Synchrotron (DE)) Jaap Velthuis Joel Goldstein (University of Bristol (GB)) Marc Weber (KIT - Karlsruhe Institute of Technology (DE)) Philip Burrows (Oxford University) Renato Turchetta (STFC - Rutherford Appleton Lab. (GB)) Dr Stephen Mcmahon (STFC - Rutherford Appleton Lab. (GB)) Steven Worm (STFC - Rutherford Appleton Lab. (GB))

Presentation Materials

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