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2nd TCT Workshop

17–18 Oct 2016
Jožef Stefan Institute
Europe/Zurich timezone

Session

New ways of using TCT

17 Oct 2016, 11:20
Main Lecture Hall (Jožef Stefan Institute)

Main Lecture Hall

Jožef Stefan Institute

Jamova 39 SI-1000 Ljubljana

Description

Timing, Single Event Upset, Defect investigation

Presentation materials

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  1. 7. Laboratory results on LGADs (Timming)
    Marco Ferrero (Universita e INFN Torino (IT))
    17/10/2016, 11:20
  2. 8. TCT in presence of continuos illumination - studies of bulk material
    Gregor Kramberger (Jozef Stefan Institute (SI))
    17/10/2016, 11:40
  3. 25. Resolving authentic time dependence of time-of-flight photocurrent in organic semiconductors
    Egon Pavlica (University of Nova Gorica)
    17/10/2016, 12:00

    Time-of-flight photoconductivity (TOF) is a powerful method, which is used to study conversion of photons to electrons and their transport through thin organic semiconductor layers. Compared to current-voltage characterization methods, TOF results are unaffected by the spurious effects at the semiconductor/metal interfaces. Precise knowledge of photocurrent time-dependence is of crucial...

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  4. 6. Single event effect tests with focused light
    Samo Korpar (Jozef Stefan Institute (SI))
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