Time-of-flight photoconductivity (TOF) is a powerful method, which is used to study conversion of photons to electrons and their transport through thin organic semiconductor layers. Compared to current-voltage characterization methods, TOF results are unaffected by the spurious effects at the semiconductor/metal interfaces. Precise knowledge of photocurrent time-dependence is of crucial...
1.) Analysis of the signal - reflection
2.) Mobility measurements
1.) Beam condition monitoring at work (fibre split and in-beam version)
2.) Cabling issues and related problems
3.) Tunning the right signal
4.) Beam locator