2nd TCT Workshop

Session

Results from recent TCT measurements on different detector structures

Oct 17, 2016, 4:00 PM

Main Lecture Hall (Jožef Stefan Institute)

9. Edge TCT on AMS H35 HV-CMOS devices

Emanuele Cavallaro (IFAE - Barcelona (ES))

10/17/16, 4:00 PM

16. Edge-TCT measurements on different HVCMOS devices

Bojan Hiti (Jozef Stefan Institute (SI))

10/17/16, 4:20 PM

11. Edge-TCT measurements

Finn Feindt (University of Hamburg)

10/18/16, 9:30 AM

10. TCT measurements on 3D detectors

Lluis Simon

10/18/16, 9:50 AM

24. TCT measurements on diodes

William Holmkvist (C)

10/18/16, 10:10 AM

26. Temperature dependance of LGAD response

Roberto Mulargia (Universita e INFN Torino (IT))

10/18/16, 10:30 AM

17. Comparison of different simulations tools and update on KDetSim

Gregor Kramberger (Jozef Stefan Institute (SI))

12. Mobility measurements

18. TCAD simulations

Marco Bomben (Centre National de la Recherche Scientifique (FR))

19. Update on TRACS simulation