Description
Timing, Single Event Upset, Defect investigation
Marco Ferrero
(Universita e INFN Torino (IT))
10/17/16, 11:20 AM
Gregor Kramberger
(Jozef Stefan Institute (SI))
10/17/16, 11:40 AM
Egon Pavlica
(University of Nova Gorica)
10/17/16, 12:00 PM
Time-of-flight photoconductivity (TOF) is a powerful method, which is used to study conversion of photons to electrons and their transport through thin organic semiconductor layers. Compared to current-voltage characterization methods, TOF results are unaffected by the spurious effects at the semiconductor/metal interfaces. Precise knowledge of photocurrent time-dependence is of crucial...
