An innovative X-ray imaging sensor based on Chromatic Photon Counting technology
with intrinsic digital characteristics is presented. The system counts individually the incident X-ray photons and selects them according to their energy to produce two color images per exposure. The energy selection occurs in real time and at radiographic imaging speed (GHz global counting rate).
Photon counting,...
We discuss the performances measured in laboratory of a MAPS prototype we developed with a pixel architecture allowing substrate depletion from the front side. The sensor was fabricated in a 180 nm CMOS Image Sensor Technology and features 4 matrices of 16 x 128 pixels with 22 x 22 µm² pitch. For all matrices, the charge sensing diode is AC-coupled to a source follower or amplifier and is...
We report a fabrication process of pixel detectors made of bulk Cadmium Telluride (CdTe) crystals. Prior the processing the quality and defect density in CdTe material was characterized by infrared (IR) spectroscopy. The semiconductor detector and Flip-Chip (FC) interconnection processing was carried out in clean room premises of Micronova center in Espoo, Finland. The chip scale processes...
X-ray phase contrast imaging (XPCI) detects signals arising from the phase shifts suffered by x-rays as they traverse matter. Unlike other approaches, Edge illumination (EI) XPCI can be implemented with large focal spot and polychromatic (i.e. conventional) sources. It normally employs a pre-sample and a detector mask: the first splits the beam into a series of beamlets, and the second...
High intensity lasers, such as the Vulcan and the Gemini Lasers at the Rutherford Appleton Laboratory, can be used to generate high-intensity ultra-short pulses of energetic radiation. The advent of new high-repetition laser technology, such as DIPOLE, make laser driven radiation a potential source for future science facilities and industrial applications. The characterisation and exploitation...
