Speaker
Manuel Cargnelutti
(Instrumentation Technologies)
Description
One of the frontiers that novel beam diagnostics and readout electronics will explore in the future is bunch-by-bunch information. Both for the electron synchrotrons and for the high repetition rate LINACs, bunch-by-bunch beam information will be useful to better understand and control the machine. As a first step to explore this field, I-Tech prototyped a 500MSps digitizer which features 4 input channels with large dynamic range and wide bandwidth. The ADC sampling is controlled through a PLL which is locked to an external reference signal. In this contribution the measurements and characterizations achieved with a single-channel prototype are presented.
Author
Manuel Cargnelutti
(Instrumentation Technologies)
