Oct 21 – 26, 2018
Asia/Kolkata timezone

Quality control for ATLAS ITk strip sensor production

Not scheduled
15m

Speaker

Mr Christoph Thomas Klein (Cavendish Laboratory, University of Cambridge)

Description

With the upgrade of the LHC to the High-Luminosity LHC (HL-LHC), scheduled to commence in 2024, the Inner Detector will be replaced with the new all-silicon ATLAS Inner Tracker (ITk) to maintain tracking performance in this high-occupancy environment and to cope with the increase of approximately a factor of ten in the integrated radiation dose. The outer four layers in the barrel and six disks in the endcap region will consist of strip modules, built with single-sided strip sensors and glued-on hybrids carrying the front-end electronics necessary for readout.

The strip sensors are manufactured as n-in-p strip sensors from high-resistivity silicon, which would allow operation even after fluences expected towards the end of the proposed lifetime of the HL-LHC. Prototypes of different sensor designs have been extensively tested electrically as well as in testbeam setups, yielding mixed results especially in terms of long-term stability. Since pre-production is scheduled to start at the end of 2019, it has become increasingly necessary to have a quality control (QC) procedure for strip sensors which can identify emerging problems with manufacturing results for single sensors or whole batches, ranging from generic electric properties to reliability of long-term operation, as well as understanding the underlying processes. An overview over the QC procedure and its results will be given as well as details about the ongoing challenges.

Primary author

Mr Christoph Thomas Klein (Cavendish Laboratory, University of Cambridge)

Presentation materials

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