Speaker
Andrea Garcia Alonso
(Universidad de Cantabria (ES))
Description
Pixelated 3D sensors with two different cell form factors( 50 um x 50 um, and 25 um x 100 um with one and two junctions)
were characterized at the SPS test beam. The samples were fabricated at FBK using a single side technology.
Sensors were readout with the RD53A ROC. Results on hit efficiency, cluster size and hit position residuals for fresh and
irradiated (1E16 n_eq/cm2) samples are presented. The response against bias voltage and temperature is also considered.
Author
Andrea Garcia Alonso
(Universidad de Cantabria (ES))
