Login

FuTuRe 2019 - Workshop on the Future of Silicon Detector Technologies

2–3 Dec 2019
CiS Forschungsinstitut fuer Mikrosensorik
Europe/Berlin timezone

Contact

Session

Defect Engineering

3 Dec 2019, 13:00
CiS Forschungsinstitut fuer Mikrosensorik

CiS Forschungsinstitut fuer Mikrosensorik

Konrad-Zuse-Str. 14 99099 Erfurt, Germany

Description

The greatest challenges in defect engineering occur mainly in those sensors and detectors that are exposed to intense high energy radiation.

Presentation materials

There are no materials yet.

  1. 27. Density Functional Theory-based theory of defects
    Prof. Erich Runge (Technische Universität Ilmenau)
    03/12/2019, 13:00
  2. 28. Development of Radiation Hard Silicon Detectors - The RD50 collaboration
    Michael Moll (CERN)
    03/12/2019, 13:30
  3. 29. Light-induced defects in silicon solar cells: a possible impact on the mainstream silicon technology
    Mr Teimuraz Mchedlidze (TU Dresden)
    03/12/2019, 14:00
  4. 30. Defects in 6“ Cz Si EPI-wafer
    Mrs Daniela Seifert (X-FAB Semiconductor Foundries GmbH)
    03/12/2019, 15:00
  5. 31. Low gain avalanche detectors (LGAD) – Can the A_Si-Si_i defect explain their insufficient radiation hardness?
    Kevin Lauer (CIS Institut fuer Mikrosensorik GmbH (DE))
    03/12/2019, 15:30
  6. 32. Discussion
    03/12/2019, 16:00
Building timetable...