Description
The greatest challenges in defect engineering occur mainly in those sensors and detectors that are exposed to intense high energy radiation.
Prof.
Erich Runge
(Technische Universität Ilmenau)
03/12/2019, 13:00
Michael Moll
(CERN)
03/12/2019, 13:30
Mr
Teimuraz Mchedlidze
(TU Dresden)
03/12/2019, 14:00
Mrs
Daniela Seifert
(X-FAB Semiconductor Foundries GmbH)
03/12/2019, 15:00
Kevin Lauer
(CIS Institut fuer Mikrosensorik GmbH (DE))
03/12/2019, 15:30