Description
The greatest challenges in defect engineering occur mainly in those sensors and detectors that are exposed to intense high energy radiation.
Prof.
Erich Runge
(Technische Universität Ilmenau)
12/3/19, 1:00 PM
Michael Moll
(CERN)
12/3/19, 1:30 PM
Mr
Teimuraz Mchedlidze
(TU Dresden)
12/3/19, 2:00 PM
Mrs
Daniela Seifert
(X-FAB Semiconductor Foundries GmbH)
12/3/19, 3:00 PM
Kevin Lauer
(CIS Institut fuer Mikrosensorik GmbH (DE))
12/3/19, 3:30 PM