Description
Compression monitors, short bunch length diagnostics, microbunching instability monitors, and more generally diagnostics that are NOT based on an external laser probe.
Including but not limited to:
- THz/IR spectrometer-based diagnostics of short electron bunches (e.g., compression monitors)
- Diagostics based on arrays of THz detectors
- etc.
Location to be decided:
- CERLA
- or P5-bis building, Room 172 (1st floor)
- or P5-bis building, Salle du conseil room (2nd floor)
Including, but not limited to:
* Laser-based diagnostics:
- Electro-optic detection of electric fields
- X-ray-induced transient reflectivity,
- optical transposition
- etc.
* Diagnostics based on electron bunch deflection:
- RF-based transverse cavities
- THz electric field-induced deflection (split-ring resonators, etc.)
- etc.
Location to be decided:
- CERLA
- or P5-bis...
Location to be decided:
- CERLA
- or P5-bis building, Room 172 (1st floor)
- or P5-bis building, Salle du conseil room (2nd floor)