Description
Compression monitors, short bunch length diagnostics, microbunching instability monitors, and more generally diagnostics that are NOT based on an external laser probe.
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Nils Maris Lockmann30/06/2022, 10:30
Including but not limited to:
- THz/IR spectrometer-based diagnostics of short electron bunches (e.g., compression monitors)
- Diagostics based on arrays of THz detectors
- etc.Location to be decided:
Go to contribution page
- CERLA
- or P5-bis building, Room 172 (1st floor)
- or P5-bis building, Salle du conseil room (2nd floor) -
49. Diagnostics in the time domain (EO, streaking, etc.) - Chairs: Bernd Steffen and Serge BielawskiBernd Steffen, Prof. Serge Bielawski30/06/2022, 10:30
Including, but not limited to:
* Laser-based diagnostics:
- Electro-optic detection of electric fields
- X-ray-induced transient reflectivity,
- optical transposition
- etc.
* Diagnostics based on electron bunch deflection:
- RF-based transverse cavities
- THz electric field-induced deflection (split-ring resonators, etc.)
- etc.Location to be decided:
Go to contribution page
- CERLA
- or P5-bis... -
Dr Michele Caselle (KIT - Karlsruhe Institute of Technology (DE))30/06/2022, 10:30
Location to be decided:
Go to contribution page
- CERLA
- or P5-bis building, Room 172 (1st floor)
- or P5-bis building, Salle du conseil room (2nd floor) -