# Wednesday 3.June
9:40-12:30 Session: Defect and Material Characterization
12:30-14:00 Lunch
14:00- 17:00 Session: TCT; NIEL; Radiation Facilities
17:30 Collaboration Board
# Thursday 4.June
10:00-12:30 Session: Simulation & LGAD
12:10-13:20 Lunch
13:20- 18:00 Session LGAD
# Friday 5.June
11:00 - 12:00 EP seminar on LGAD
12:00-13:00 Lunch break
13:00 16:00 CMOS sensors
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The registration fee is 0 CHF / 0 euros.
Registration is required. Video (zoom) coordinates will be distributed to participants only.
