3rd MC-PAD Network Training Event / Midterm Review

Name: 3rd MC-PAD Network Training Event / Midterm Review
Start: 2010-09-26T00:00:00+02:00
End: 2010-09-30T18:00:00+02:00
Location: Jožef Stefan Institute

26–30 Sept 2010

Jožef Stefan Institute

Europe/Zurich timezone

Overview
Scientific Programme
Call for Abstracts
Timetable
Contribution List
Author List
Book of Abstracts
Registration
List of registrants

Effects of radiation to device performance

27 Sept 2010, 11:00

45m

Main Lecture Hall (Jožef Stefan Institute)

Main Lecture Hall

Jožef Stefan Institute

Radiation hardness of semicomductor detectors Radiation hardness of semiconductor detectors

Michael Moll (CERN, Geneve)

Slides

10-09-27-MC-PAD-Moll-100926-no-hidden.pdf

10-09-27-MC-PAD-Moll-100926.pdf

10-09-27-MC-PAD-Moll-100926.pptx

3rd MC-PAD Network Training Event / Midterm Review

Effects of radiation to device performance

Main Lecture Hall

Jožef Stefan Institute

Speaker

Primary author

Presentation materials

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3rd MC-PAD Network Training Event / Midterm Review

Speaker

Primary author

Presentation materials