The RADSAGA proposal coordinator (Markus) and present project leader (Rubén) will take you on a journey from RADSAGAs’ conceptual birth to its impact on future activities. Be seated!
In WP1, an extensive review of radiation test facilities involved in the consortium was carried out. The homogeneous description and comparison of the relevant test parameters (i.e. particle flux, energy spectra, beam size, etc.) in different European test facilities provides a valuable information for the European industry to select test facilities and prepare radiation test campaigns focused...
Single event cross sections caused by direct ionization effects in sub micron technology are investigated. Focus is on the modeling of the proton direct ionization cross section. Good agreement between modeled, simulated and experimental values has been achieved. Furthermore proton direct ionization cross-sections for heavy ions will be considered.
Electron-induced radiation effects in electronics becomes increasingly important as technology node sizes decrease. In this presentation, results of electron-induced single-event effects on SDRAMs are presented, and in particular stuck bits are discussed. Novel means of monitoring a pulsed electron beam using doped silica glass rods and optical fibers are also presented.
In order to investigate the capability of a silicon microdosimeter and the PTW microDiamond detector to measure LET distributions, an experimental set-up has been developed at UMCG. The vacuum chamber is suitable for measurements with different detectors with the potential of adding new devices and can be directly attached to the beamline at the UMCG PARTREC accelerator facility. In the...
The radiation environment in space poses unique challenges to the successful operation of electronic components exposed to it. It is hence important to test the devices sufficiently before their integrating them in space missions, if possible already during their design phase. Likewise, radiation effects on electronics pose reliability and availability threats for high-energy accelerator...
A flexible SRAM based SEU radiation monitor has been designed, simulated and tested. Its SEU sensitivity can be tuned by varying the cells supply voltage. The data collected from heavy ions, high-energy protons, neutrons and low-energy protons shows that changing the core voltage of the chip can significantly affect the SEU sensitivity.
In WP2, the focus has been set on reliable state-of-the-art electronic components. Devices of strategic importance, for industrial and technological applications, such as a high-reliability integrated time-based signal processing circuit or a CMOS imager have been designed in mainstream CMOS technologies, with the requirement of tolerating radiation levels, orders of magnitude larger than...
Sensor interfaces (resistive, capacitive etc.) are integral part of high reliable applications like space, flight, nuclear power plants as well as automotive systems. In the presence of ionizing radiations, total ionizing dose (TID) gradually degrades the performance of integrated CMOS circuits and single event effects (SEEs) create instantaneous voltage fluctuations especially affecting...
In recent years, the power electronics industry has been rapidly evolving thanks to wide
bandgap (WBG) semiconductor materials such as silicon carbide and gallium nitride. However, those materials are still relatively recent within the power semiconductor devices and there are still some technological barriers, which need to be overcome to ensure reliable operation throughout their lifetime...
Abstract
The radiation effects community in the United States is facing challenges on two fronts: grow capacity for low-energy (≤50 MeV/amu) heavy ion single-event effects (SEE) testing and expand capabilities for high-energy (≥100 MeV/amu) SEE testing. These needs are driven by the evolution of semiconductor technology as well as the types and number of civil space systems required to meet...
Most reliability evaluations of radiation effects for advanced technology nodes are conducted on fresh circuits, leaving the coupled effect of radiation and aging degradation unknown. A test vehicle (ProArray) of programmable arrays of transistors and shift-register chains was specially designed to investigates the impact of aging degradation mechanisms on the radiation susceptibility of 28 nm...
Single-Event Transient (SET) effect is increasing in importance in advanced technologies due to the reduction in the inherent masking effect of logical circuits. Thus, in order to improve the reliability of electronics systems operating in a harsh environment, different radiation hardening techniques at design level have been studied in this thesis.
Single Event latchup (SEL) is a potential catastrophic condition that affects CMOS technology. If a radiation particle hits the component, electron-hole pairs are generated in the structure and thus they can lead to the activation of the parasitic thyristors if the deposited energy is large enough. However, the deposited energy by the radiation particle is not the only parameter to consider as...
Increase of dark current is one of the main problems of CMOS image sensors when exposed to ionizing radiation. This is very process and layout dependent. A test chip is designed that has arrays of pixels. Multiple photosensitive devices and layout configurations were included to reduce the dark current without affecting the optical sensitivity of the pixel. This presentation will discuss these...
Closely linked to WP2, WP3 addressed the decisive question of how system tests will be able to provide reliability information as opposed to the standard bottom-up individual component characterization, which is hardly practical for modern digital integrated circuits hosting a vast amount of devices. This WP made also use of the results obtained in WP1, as the feasibility and preparation of a...
The objective of this work, in the context of the European RADSAGA project, is to propose a new methodology for radiation hardness assurance of digital systems. We investigate the possibility to define an intermediate approach that would combine the concept of system-level testing with the existing knowledge and best practices of component-level methods. Our methodology is developed and...
In this presentation, main results related to the system qualification methodology development will be presented. The focus will be given on the opportunities that one may get thanks to the system-level testing as well as the definition of the main limitations for the qualification based on the system-level radiation tests. Because the complete system qualification, i.e. the one that would...
Abstract
From the perspective of a space system provider, the need of supplying radiation robust products to multiple customers requires a cost/schedule effective approach of the RHA process, while being aware and understanding the associated risks. This remains the case in the frame of the “new business” addressed by Airbus Defence and Space.
The presentation will then address how...
System-level tests play a significant role in electronic devices' qualification and in combination with the component-level testing gives a more precise understanding of their behavior in the harsh radiation environment. They are especially relevant in the case of accelerators, where highly complex systems are employed and a high degree of reliability is imposed. System-level tests must...
Device integration and advanced packaging bring several challenges to standard radiation hardness assurance practices. These are mainly related to sensitivity to weakly ionizing particles as well as ensuring the representativeness of the test, such as the use of protons as a proxy to ions. The relevance of these emerging out-of-the-standard radiation effects was assessed for singly-charged...
Abstract of the presentation
The test of electronic components to radiation effects is the first step of radiation hardness assurance, to demonstrate their capability to meet the mission system requirements. After a short introduction on ESA’s missions, the presentation will address the evolution of technologies, the increasing complexity of space systems, and the challenges to test...
Speaker Prof. R. Schrimpf
Abstract of the presentation
The effects of radiation on electronic devices and systems have been an important area of research since the 1960s. Early researchers and practitioners were typically trained in physics and little specialized knowledge about the effects of radiation on semiconductor devices was available. This began to change in the 1950s, and...
Moderator: R. Garcia Alia
Participants:
- Prof. R. Schrimpf and Prof. K. Galloway from Vanderbilt University
- R. Mangeret from Airbus Defence Space
- M Brugger from CERN
- V. Ferlet-Cavrois from ESA
- J. Pellish from NASA
- G. Donini from the European Commission
The RADSAGA ITN is a wide research and training project involving about 30 partners and training 15 Early Stage Researchers. Training, communication and data sharing are key values for the project.
The project provided innovative and interdisciplinary training adapted to radiation effects scientists and engineers. The program has also covered topics as entrepreneurship, knowledge transfer and...
Abstract:
The main scope of this presentation is the test of SEEs induced by neutrons on electronics intended to be operated in a neutron flux near a fusion reactor (DD or DT plasma neutrons). Regardless of the intensity of the gamma and neutron fluxes, this presentation focuses on the energy spectra of neutrons and its effects, whose energy degradation can vary from one place to another in...
The presentation will cover topics related to the Marie Skłodowska-Curie Actions Program in Horizon Europe:
- MSCA Doctoral Networks
- MSCA Postdoctoral Fellowships
- MSCA Staff Exchanges
- MSCA COFUND
- MSCA and Citizens
Short biography of the speaker
Giuliana has been working at the European Institutions since 2003 starting at the Directorate General for Research and then...
The RADNEXT Consortium is composed of 35 partners.
20 of them will shortly present their activities/ contributions to the RADNEXT project.
In the work package WP6-JRA2, the main goal will be the exploration of valid qualification procedures to be effective at system level. For this purpose, we define with the term system as a structure composed of basic electronic elements such as transistors, diodes, capacitors and complex elements such as ADC/DAC converters, frequency synthesizers, voltage regulators, memories, processors,...
In this Work Package (WP7-JRA3) a study of the cumulative radiation effects on electronics will be accomplished. Cumulative effects in electronics are highly relevant both for actual applications (e.g. space, high-energy accelerators, nuclear dismantling, etc.) as well as related to by-product effects of Single Event Effects (SEE) testing.
Two main tasks will be studied. The first one is...
This WP will develop and apply tools and approaches for modelling radiation effects on electronics. These require a multi-physics approach, at radiation-matter interaction, semiconductor physics and circuit level. The modelling efforts will be focused on:
Benchmarking simulation tools to be used for SEE applications as complement to experimental data, in order to enhance the understanding...
In this Work Package (WP5-JRA1), the RADNEXT facilities and user needs will be defined and answered in terms of radiation detectors, beam instrumentation and dosimetry. This Work Package includes three main tasks:
- To define the correlation matrix between the identified needs and the established or innovative monitoring solutions as well as the definition and standardization of the...
The RADNEXT Consortium is composed of 35 partners.
15 of them will shortly present their activities/ contributions to the RADNEXT project.
The work package will provide transnational access to 14 facilities for the irradiation of electronics with neutron, muon and mixed-fields. The offer of neutron beams is the core of the WP, and covers a wide range of energy and fluxes, including atmospheric neutrons, thermal neutrons, monoenergetic and quasi-monoenergetic, low and intermediate energy white beams. Two facilities, providing...
This WP provides Transnational Access for scientific users to a diverse network of proton and heavy-ion facilities providing energetic beams for SEE testing. The beam energies provided are ranging from low energy protons of below MeV energies up to ultra high heavy ions at several GeV/u. There are also facilities capable of producing highly focused micro ion beams that will be useful in...
The overall objective of the communication, dissemination, exploitation and training activities within RADNEXT is to increase and maximize the project impact (economic, commercial, societal, environmental, technical, educational, and scientific).
A variety of media will be used for attracting new users (e.g. SMEs), demonstrating relevance of accelerator infrastructures for society, creating...
Efficiently awarding beam time to radiation effects users worldwide will be the cornerstone of the RADNEXT project, therefore a clear and effective approach to the Transnational Access is a key requisite for success.
To this aim, WP2 is fully devoted to the management of the Transnational Access (TA) activities: application for beam time, coordination of the user selection and support,...
The objective of this WP is to define roadmaps and provide recommendations for upgrades of current facilities and design of future ones. The WP4 goal is to underline long-term scientific, technological and industrial needs in order to prepare irradiation facilities and improve the usability of them. This task is addressed by analyzing the present and future industrial and scientific...
- Introduction to WP1 - A. Javanainen (15min)
- 3 ESRs from WP1 (20 min presentation and 5 min question)
