Speakers
Prof.
Alexander Koelpin
(BTU)
Alexander Kolpin
(Friedrich Alexander Univ. Erlangen (DE))
Description
Closely linked to WP2, WP3 addressed the decisive question of how system tests will be able to provide reliability information as opposed to the standard bottom-up individual component characterization, which is hardly practical for modern digital integrated circuits hosting a vast amount of devices. This WP made also use of the results obtained in WP1, as the feasibility and preparation of a full-system test largely depends on the radiation facility parameters (i.e. beam size, beam energy, etc.) as well as the interaction of the radiation environment with the system components (i.e. stopping particles, generation of secondary particles, etc.). These parameters have been carefully considered through Monte Carlo simulations.
