Speaker
Mr
Arijit Karmakar
(KU Leuven - RADSAGA ESR6)
Description
Sensor interfaces (resistive, capacitive etc.) are integral part of high reliable applications like space, flight, nuclear power plants as well as automotive systems. In the presence of ionizing radiations, total ionizing dose (TID) gradually degrades the performance of integrated CMOS circuits and single event effects (SEEs) create instantaneous voltage fluctuations especially affecting digital, memory and switched capacitor circuits. This project focuses on defining new sensor readout architectures based on time-domain signal processing for critical reliability application in harsh radiation environment. The research output with proposed sensor interfaces and measurement results will be presented.
Author
Mr
Arijit Karmakar
(KU Leuven - RADSAGA ESR6)
