Speakers
Ygor AGUIAR
(University of Montpellier - RADSAGA ESR9)
Ygor Aguiar
(CERN)
Description
Single-Event Transient (SET) effect is increasing in importance in advanced technologies due to the reduction in the inherent masking effect of logical circuits. Thus, in order to improve the reliability of electronics systems operating in a harsh environment, different radiation hardening techniques at design level have been studied in this thesis.
