Trends and Perspectives in Detector Electronics

by Jorgen Christiansen (CERN)

Friday 4 May 2012, 11:00 → 12:00 Europe/Zurich

40 - S2 - A01 (Salle Andersson) (CERN)

The fast pace of continuous improvements to electronics technologies is one of the major foundations onto which modern HEP experiments are built. All large and high channel count detectors today relies fully on customized Application Specific Integrated Circuits (ASIC’s) to make high channel count, low noise, high rate and radiation tolerant front-end electronics at an acceptable cost and sufficiently low power. The state of art electronics in current HEP experiments is summarized and perspectives for electronics for next generation experiments are presented.

Slides Trends_HEP_electronics.pdf Trends_HEP_electronics.pptx