21–23 Jun 2021
Europe/Zurich timezone

The performance of IHEP-NDL and IHEP-IME LGAD sensors after neutron Irradiation

22 Jun 2021, 10:00
20m

Speaker

Mengzhao Li (Chinese Academy of Sciences (CN))

Description

The Institute of High Energy Physics, Chinese Academy of Sciences (IHEP, CAS) has designed two types of LGAD sensors, which are produced in the Novel Device Laboratory (NDL) and Institute of Microelectronics (IME) respectively. The sensors of the two foundries were irradiated with neutrons to fluences of 0.8e15, 1.5e15 and 2.5e15 neq/cm2 in Institut Jozef Stefan (JSI). The timing resolution and collected charge of LGAD sensors were measured with electrons from a beta source. After irradiation with a fluence of 2.5e15 neq/cm2, the collected charge of the IHEP-NDL (IHEP-IME) sensor can be greater than 7 (9) fC, and the time resolution is better than 39 (50) ps.

Author

Mengzhao Li (Chinese Academy of Sciences (CN))

Co-authors

Zhijun Liang (Chinese Academy of Sciences (CN)) Yunyun Fan (Chinese Academy of Sciences (CN)) Xuewei Jia (Chinese Academy of Sciences (CN)) Mei Zhao (Chinese Academy of Sciences (CN)) Xin Shi (Chinese Academy of Sciences (CN)) Joao Barreiro Guimaraes Da Costa (Chinese Academy of Sciences (CN)) Gregor Kramberger (Jozef Stefan Institute (SI))

Presentation materials