Speaker
Bojan Hiti
(Jozef Stefan Institute (SI))
Description
The talk will present the status of the Two Photon Absorption TCT system at JSI Ljubljana. The setup has been equipped with an imaging system for beam location. TPA-TCT was used to characterize an active pixel in the RD50-MPW2 CMOS chip. An attempt to induce Single Event Burnout (SEB) events in irradiated LGAD samples will also be presented.
Author
Bojan Hiti
(Jozef Stefan Institute (SI))