RD50-MPW3: Testbeam and System Integration

2 Dec 2022, 10:00
20m
Salón de Grados, 2nd Floor (ETSI Seville)

Salón de Grados, 2nd Floor

ETSI Seville

Escuela Técnica Superior de Ingenieros Camino de los Descubrimientos s/n 41092 Isla de la Cartuja, Sevilla Spain

Speaker

Patrick Sieberer (Austrian Academy of Sciences (AT))

Description

This contribution is a continuation of the talk “RD50-MPW3: Design and initial laboratory evaluation”. This presentation focuses on the readout of the chip including the DAQ framework and preliminary testbeam results, thus it is discussing a distinct topic.

The readout framework is based on the Caribou system (as for our previous chips as well) and details about firmware, data flow and synchronization in a testbeam environment are given. The reference detector and their role in the analysis is explained as well as the integration into the EUDAQ2 framework.

An overview of the outcomes from our testbeam, including take-home messages for using the whole setup and first result of measurements from RD50-MPW3 are given.

Primary author

Patrick Sieberer (Austrian Academy of Sciences (AT))

Presentation materials