Speaker
Description
Low-Gain Avalanche Diodes (LGADs) with an active thickness of $\sim$50 $\mu$m have shown precise timing capabilities, achieving resolutions around 30 ps, as well as precise spatial resolution. As of now, their performance seem not to be affected by the radiation, at least up to fluences of 2.5$\times$10$^{15}$ 1 MeV n$_{eq}$/cm$^2$. In late 2022, FBK developed a batch of thin LGADs with thicknesses between 15 and 45 $\mu$m, which proved that reducing the substrate thickness further enhances timing resolution and radiation tolerance.
The sensors feature an engineered design optimized for high electric fields and thin substrates, together with the use of boron and carbon co-implantation in the multiplication region, improving the sensors radiation resistance. These are the most radiation-tolerant LGADs produced by FBK, so far.
Extensive tests, including I-V and C-V measurements, laser stimuli, and charged particle interactions, were performed before and after irradiation. The study focused on how reduced thickness impacts collected charge and timing resolution, crucial for high-performance sensors in radiation-heavy environments.
This new generation of LGAD sensors sets a benchmark for radiation-resistant detectors, offering enhanced timing precision and durability, critical for high-energy physics applications. The latest results on sensor characterization before and after irradiation will be presented, along with the most recent timing resolution outcomes.
