Speaker
Description
In collaboration with Fondazione Bruno Kessler, the Paul Scherrer Institute is developing Low-Gain Avalanche Diode (LGAD) sensors for soft X-ray science at synchrotrons and free electron lasers. While hybrid pixel detectors using standard silicon sensors are limited to photon energies above 1 keV due to quantum efficiency and signal-to-noise ratio constraints, LGAD technology extends their use to soft X-rays. Techniques such as Resonant Inelastic X-ray Scattering (RIXS) can benefit from the high frame rates and large area coverage offered by these detectors. This contribution presents the development of inverse LGAD (iLGAD) sensors for soft X-rays, focusing on their use with the charge-integrating JUNGFRAU chip in RIXS experiments. We utilize rectangular pixels with a 25 µm pitch that enable high spatial resolution through position interpolation. Results from pilot experiments at the European XFEL and SwissFEL are discussed, along with ongoing improvements and future plans
